High polarization stability induced by light-activated defect engineering in ferroelectric single crystals
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Published:2024-09
Issue:
Volume:276
Page:120119
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ISSN:1359-6454
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Container-title:Acta Materialia
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language:en
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Short-container-title:Acta Materialia
Author:
Jin Xinyu,
Wang Yu,
Meng Xiangda,
Liu Mingxuan,
Xing Bohan,
Wen Xing,
Huang Xiaolin,
Wang Xiaoou,
Hu Chengpeng,
Tan PengORCID,
Tian HaoORCID