Dynamic evolution of internal stress, grain growth, and crystallographic texture in arc-evaporated AlTiN thin films using in-situ synchrotron x-ray diffraction
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Published:2024-06
Issue:
Volume:272
Page:119899
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ISSN:1359-6454
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Container-title:Acta Materialia
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language:en
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Short-container-title:Acta Materialia
Author:
Nayak Sanjay,
Hsu Tun-Wei,
Boyd Robert,
Gibmeier Jens,
Schell Norbert,
Birch Jens,
Rogström LinaORCID,
Odén MagnusORCID
Funder
Swedish Research Council
VINNOVA