In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction—A powerful new technique for the characterization of electrochemical surfaces and interfaces-Reference-Cited by-同舟云学术

In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction—A powerful new technique for the characterization of electrochemical surfaces and interfaces

Published:2006-08 Issue:26 Volume:51 Page:5920-5925
ISSN:0013-4686
Container-title:Electrochimica Acta
language:en
Short-container-title:Electrochimica Acta

Author:

De Marco Roland,Jiang Zhong-Tao,Martizano Jay,Lowe Alex,Pejcic Bobby,van Riessen Arie

Publisher

Elsevier BV

Subject

Electrochemistry,General Chemical Engineering

Reference39 articles.

1. Complexation by natural heterogeneous compounds: Site occupation distribution functions, a normalized description of metal complexation

2. Ion Selective Electrochemical Sensors—Fe+3, Cu+2

3. Reinvestigation of a ferric ion-selective electrode based on the chalcogenide glass FexSe60Ge28Sb12(x = 1-10)

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