Nafion thickness dependence of H2O2 yield during O2 reduction at Nafion/Pt microelectrode studied by scanning electrochemical microscopy-Reference-Cited by-同舟云学术

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Nafion thickness dependence of H2O2 yield during O2 reduction at Nafion/Pt microelectrode studied by scanning electrochemical microscopy

Published:2013-12 Issue: Volume:113 Page:773-778
ISSN:0013-4686
Container-title:Electrochimica Acta
language:en
Short-container-title:Electrochimica Acta

Author:

Shironita Sayoko,Sakai Tsukasa,Umeda Minoru

Funder

MEXT/JSPS KAKENHI

Publisher

Elsevier BV

Subject

Electrochemistry,General Chemical Engineering

Reference31 articles.

1. Effects of contaminants on catalyst activity;Garzon,2009

2. Chemical degradation of perfluorinated sulfonic acid membranes;Inaba,2009

3. Highly durable PFSA membranes;Endoh,2009

4. Performance and durability of a polymer electrolyte fuel cell operating with reformate: effects of CO, CO2, and other trace impurities;Du,2009

5. Dissolution and stabilization of platinum in oxygen cathodes;Sasaki,2009

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