High-throughput scanning electrochemical microscopy brushing of strongly tilted and curved surfaces-Reference-Cited by-同舟云学术

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High-throughput scanning electrochemical microscopy brushing of strongly tilted and curved surfaces

Published:2013-11 Issue: Volume:110 Page:30-41
ISSN:0013-4686
Container-title:Electrochimica Acta
language:en
Short-container-title:Electrochimica Acta

Author:

Lesch Andreas,Momotenko Dmitry,Cortés-Salazar Fernando,Roelfs Folkert,Girault Hubert H.,Wittstock Gunther

Funder

Deutsche Forschungsgemeinschaft

Fonds National Suisse pour la Recherche Scientifique

Publisher

Elsevier BV

Subject

Electrochemistry,General Chemical Engineering

Reference59 articles.

1. Measurements within the diffusion layer using a microelectrode probe;Engstrom;Analytical Chemistry,1986

2. Scanning electrochemical and tunneling ultramicroelectrode microscope for high-resolution examination of electrode surfaces in solution;Liu;Journal of the American Chemical Society,1986

3. Chemical imaging of surfaces with the scanning electrochemical microscope;Bard;Science,1991

4. Scanning electrochemical microscopy for direct imaging of reaction rates;Wittstock;Angewandte Chemie International Edition,2007

5. Scanning electrochemical microscopy – the application of the feedback mode for high-resolution copper etching;Mandler;Journal of the Electrochemical Society,1989

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