In situ analysis of surface morphology and viscoelastic effects during deposition of thin silicon layers from 1-butyl-1-methylpyrrolidinium bis(trifluoromethylsulfonyl)imide-Reference-Cited by-同舟云学术

In situ analysis of surface morphology and viscoelastic effects during deposition of thin silicon layers from 1-butyl-1-methylpyrrolidinium bis(trifluoromethylsulfonyl)imide

Published:2016-11 Issue: Volume:219 Page:251-257
ISSN:0013-4686
Container-title:Electrochimica Acta
language:en
Short-container-title:Electrochimica Acta

Author:

Ivanov Svetlozar,Vlaic Codruta,Bund Andreas^ORCID,Efimov Igor

Funder

DFG funded priority program WeNDeLIB

Publisher

Elsevier BV

Subject

Electrochemistry,General Chemical Engineering

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4. Electrodeposition of Silicon from Solutions of Silicon Halides in Aprotic Solvents;Agrawal;J. Electrochem.Soc.,1981

5. Electrodeposition of Silicon from a Nonaqueous Solvent;Gobet;J. Electrochem.Soc.,1988

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