Profile-driven Features for Offline Quality Prediction in Batch Processes

Author:

Rendall Ricardo,Lu Bo,Castillo Ivan,Chin Swee-Teng,Chiang Leo H.,Reis Marco S.

Publisher

Elsevier

Reference5 articles.

1. A modular simulation package for fed-batch fermentation: penicillin production;Birol;Computers & chemical engineering,2002

2. Statistics pattern analysis: A new process monitoring framework and its application to semiconductor batch processes;He;AIChE Journal,2011

3. Fault detection of batch processes using multiway kernel principal component analysis;Lee;Computers & chemical engineering,2004

4. Multi-way partial least squares in monitoring batch processes;Nomikos;Chemometrics and intelligent laboratory systems,1995

5. Rato, T.J., Blue, J., Pinaton, J., Reis, M.S., Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.

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