Exchange bias variations of the seed and top NiFe layers in NiFe/FeMn/NiFe trilayer as a function of seed layer thickness
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Exchange bias
2. Relation between microstructures and magnetic properties upon annealing in Fe50Mn50/Ni80Fe20 films
3. V.K. Sankaranarayanan, S.M Yoon, C.G. Kim, C.O. Kim, J. Appl. Phys. (2004), in press
4. Microstructure of antiferromagnetic layer affecting on magnetic exchange coupling in trilayered NiFe/25 at% NiMn/NiFe films
5. Orientational dependence of the exchange biasing in molecular‐beam‐epitaxy‐grown Ni80Fe20/Fe50Mn50bilayers (invited)
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3. Enhancement of Exchange Bias in NiFe/IrM, IrMn/NiFe and NiFe/IrMn/NiFe Structures with Different Thickness of Antiferromagnetic Layer;Solid State Phenomena;2015-07
4. Enhancement of exchange bias field in top-pinned FeMn/Py bilayers with Ta/Cu hybrid underlayers;Journal of Applied Physics;2013-08-21
5. Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias;Journal of Magnetism and Magnetic Materials;2011-07
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