Advanced output chains for CMOS image sensors based on an active column sensor approach—a detailed comparison-Reference-Cited by-同舟云学术

Advanced output chains for CMOS image sensors based on an active column sensor approach—a detailed comparison

Published:2004-10 Issue:2 Volume:116 Page:304-311
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Diller Shai,Fish Alexander,Yadid-Pecht Orly

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference9 articles.

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3. Analysis of temporal noise in CMOS photodiode active pixel sensor;Tian;IEEE J. Solid-State Circuits,2001

4. An enhanced-performance CMOS imager with a flushed-reset photodiode pixel;Pain;IEEE Trans. Electron Devices,2003

5. E.R. Fossum, Charge transfer noise and lag in CMOS active pixel sensors, in: IEEE Workshop on Charge-coupled Devices and Advanced Image Sensors, Elmau, Germany, 2003.

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