Improving Seebeck coefficient of ITO/AZO transparent film thermocouple by ITO (100) preferred orientation-Reference-Cited by-同舟云学术

Improving Seebeck coefficient of ITO/AZO transparent film thermocouple by ITO (100) preferred orientation

Published:2020-08 Issue: Volume:311 Page:112089
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Liu Hao,Zhang Xin,Wang Qizhen,Liu Zhihui,Chen Weichao,Wang Quan,Wang Hualin,Jiang Weiwei,Liu Shimin,Liu Chaoqian,Wang Nan,Cui Yunxian,Ma Yanping,Ding Wanyu

Funder

National Natural Science Foundation of China

Joint Research Fund Liaoning-Shenyang National Laboratory for Materials Science

Liaoning BaiQianWan Lalents Program

Hainan Province Key Laboratory of Special Glass

Project of Department of Education of Liaoning Province, China

Liaoning Natural Science Foundation

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Optical Thin Films and Coatings: From Materials to Applications;Piegari,2013

2. Micromachined Thin-Film Sensors for SOICMOS Co-Integration;Laconte,2006

3. Functional Thin Films and Nanostructures for Sensors: Synthesis, Physics and Applications;Zribi,2009

4. Sensors and Actuators: Engineering System Instrumentation;de Silva,2016

5. Transparent Conductive Materials Materials, Synthesis, Characterization, Applications;Levy,2018

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of ambient high-temperature annealing on microstructure, elemental composition, optical and electrical properties of indium tin oxide films;Materials Science and Engineering: B;2022-02

2. Defect governed zinc-rich columnar AZO thin film and contact interface for enhanced performance of thermocouples;Physical Chemistry Chemical Physics;2022

3. A Robust System for Thermoelectric Device Characterization;IEEE Transactions on Instrumentation and Measurement;2021