Author:
Chen Xiaomei,Longstaff Andrew,Fletcher Simon,Myers Alan
Funder
EPSRC Centre for Innovative Manufacturing in Advanced Metrology
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Probing systems for dimensional micro- and nano-metrology;Weckenmann;Measurement Science and Technology,2006
2. http://www.werth.de/en/unser-angebot/products/multisensor-cmms.html (2013).
3. Automatic micro dimension measurement using image processing methods;Cao;Measurement,2002
4. A new method for detecting the diameter and spatial location of tiny through-hole;Fei;Advanced Materials Research,2011
5. Research on real-time error measurement in curve grinding process based on machine vision;Luo;IEEE International Technology and Innovation Conference,2006
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献