Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors-Reference-Cited by-同舟云学术

Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors

Published:2021-03 Issue: Volume:319 Page:112519
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Ruppert Michael G.^ORCID,Fleming Andrew J.,Yong Yuen K.

Funder

Australian Research Council

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

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3. The chemical structure of a molecule resolved by atomic force microscopy;Gross;Science,2009

4. Assigning the absolute configuration of single aliphatic molecules by visual inspection;Ebeling;Nat. Commun.,2018

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