Electron tunneling from a metallic TS2 layer underneath an ultra-thin MS layer with semiconducting properties for misfit-layer compounds
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference21 articles.
1. Misfit Layer Compounds (MS)nTS2 (M=Sn, Pb, Bi, Rare Earth Metals; T=Nb, Ta, Ti, V, Cr; 1.08
2. Misfit layer compounds: Structures and physical properties
3. Surface analysis of two misfit layer compounds — (PbS)1.18(TiS2) and (PbS)1.18(TiS2)2 — by scanning probe microscopies (AFM and STM) and X-ray photoelectron spectroscopy (XPS)
4. Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n=1,2) and [(Pb,Sb)S)]1.14NbS2
5. Distribution of the Pb and Sb Atoms in the (Pb, Sb)S Layers of the Franckeite-Type Misfit Compound [(Pb, Sb)S]2.28NbS2 Examined by Scanning Tunneling and Atomic Force Microscopy
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1. Modulation structure in the STM images of the non-metallic misfit-layer compound (PbS)1.12VS2;Surface Science;2006-11
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