Surface structure of Si(111)-(8×2)–In determined by reflection high-energy positron diffraction
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference33 articles.
1. Density Waves in Solids;Grüner,1994
2. Surface electronic structure of a single-domain Si(111)4 × 1-In surface: a synchrotron radiation photoemission study
3. Indium-induced reconstructions of the Si(111) surface studied by scanning tunneling microscopy
4. Structure determination of the indium-inducedSi(111)−(4×1)reconstruction by surface x-ray diffraction
5. Anisotropic electronic structure of theSi(111)−(4×1)Insurface
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1. Structural dynamics in atomic indium wires on silicon: From ultrafast probing to coherent vibrational control;Progress in Surface Science;2024-06
2. Development of a new reflection high-energy positron diffractometer at NEPOMUC;INTERNATIONAL CONFERENCE ON SCIENCE AND APPLIED SCIENCE (ICSAS) 2019;2019
3. Diffraction;Monatomic Two-Dimensional Layers;2019
4. Positrons in surface physics;Surface Science Reports;2016-12
5. Surface vibrational Raman modes of In:Si(111)(4×1)and(8×2)nanowires;Physical Review B;2016-08-12
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