Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering-Reference-Cited by-同舟云学术

Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering

Published:2007-11 Issue:21 Volume:601 Page:4862-4872
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Vos M.,Went M.R.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference33 articles.

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2. Differential surface and volume excitation probability of medium-energy electrons in solids

3. Observing atom motion by electron-atom Compton scattering

4. Investigation of binary compounds using electron Rutherford backscattering

5. M. Vos, M. Went, J. Electron Spectrosc. Relat. Phenom. xx (in press) doi:10.1016/j.elspec.2007.05.003.

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