Analysis of roughness of Cs surfaces via evaluation of the autocorrelation function
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference19 articles.
1. Wetting behavior of liquidHe4on rough Cs films: Pinning, memory effect, and micropuddles
2. Novel wetting behavior in quantum films
3. Characterization of Quench-Condensed Cesium on a Nanometer Scale at Low Temperatures
4. Verification of the Lifshitz Theory of the van der Waals Potential Using Liquid-Helium Films
5. Contact angle hysteresis on nano-structured surfaces
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1. Reduction in Errors in Roughness Evaluation with an Accurate Definition of the S-L Surface;Materials;2023-02-24
2. Resolving Selected Problems in Surface Topography Analysis by Application of the Autocorrelation Function;Coatings;2022-12-31
3. Roughness Evaluation of Burnished Topography with a Precise Definition of the S-L Surface;Applied Sciences;2022-12-13
4. Selection of Methods of Surface Texture Characterisation for Reduction of the Frequency-Based Errors in the Measurement and Data Analysis Processes;Sensors;2022-01-20
5. Imaging the Nanophase-separated Structure of Block Copolymer Thin Film by Atomic Force Microscopy in Aqueous Solution;Chemistry Letters;2020-06-05
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