Epitaxial growth of bcc Fe films on Al(100) surfaces using Ti as an interface stabilizer
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
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1. Structure of V thin films on Al(100) using XPD, LEED, and LEIS;Surface Science;2012-08
2. Atomic-Scale Investigation of the Ti/Al(001) Interface: A Molecular Dynamics Simulation;Japanese Journal of Applied Physics;2010-06-21
3. Fe-Al interface intermixing and the role of Ti, V, and Zr as a stabilizing interlayer at the interface;Journal of Applied Physics;2009-03
4. Monolayer bimetallic surfaces: Experimental and theoretical studies of trends in electronic and chemical properties;Surface Science Reports;2008-05
5. Interface mixing of Al∕Fe and Fe∕Al bilayer systems and the role of Ti as a stabilizing interlayer using Rutherford backscattering spectrometry and x-ray reflectometry;Journal of Applied Physics;2008-01
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