Structural study of Si(111)–6×1-Ag surface using surface X-ray diffraction-Reference-Cited by-同舟云学术

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Structural study of Si(111)–6×1-Ag surface using surface X-ray diffraction

Published:2007-11 Issue:22 Volume:601 Page:5195-5199
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Sumitani Kazushi,Masuzawa Kosuke,Hoshino Takashi,Yoshida Ryuji,Nakatani Sinichiro,Takahashi Toshio,Tajiri Hiroo,Akimoto Koichi,Sugiyama Hiroshi,Zhang Xiao-Wei,Kawata Hiroshi

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference29 articles.

1. Study on the Si(111)$ \sqrt{3}{\times}\sqrt{3}$-Ag Surface Structure by X-Ray Diffraction

2. Refinement of the -Ag structure by surface X-ray diffraction

3. X-ray diffraction study of theSi(111)−3×3−Agsurface structure

4. Si(111)-(×)-Ag surface at low temperatures: symmetry breaking and surface twin boundaries

5. Reconstruction and growth of Ag on the Si(111)-√3 × √3 -Ag surface at low temperature

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic and electronic structures of Ag/Si(100)-c(6×2) surface: A first-principles study;Surface Science;2010-08

2. Atomic and electronic structures ofAg/Si(111)-c(12×2)surface: A first-principles study;Physical Review B;2008-12-19

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