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Measurement of the surface excitation probability of medium energy electrons reflected from Si, Ni, Ge and Ag surfaces

  • Published:2005-07 Issue:1-2 Volume:585 Page:85-94
  • ISSN:0039-6028
  • Container-title:Surface Science
  • language:en
  • Short-container-title:Surface Science

Author:

Werner Wolfgang S.M.,Kövér Lászlo,Egri Sándor,Tóth József,Varga Desző

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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1. Investigation of the effect of multiple oxidation and ion sputtering on the formation of inhomogeneous oxide layers on the surface of an ultrathin metal film;2023 5th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE);2023-03-16

2. Surface Plasmon Spectra and Dielectric Functions of Silicon, Diamond and Graphite Retrieved by Partial Intensity Approach for Reflection Electron Energy Loss Spectra;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-02

3. XPS Study of Niobium and Niobium-Nitride Nanofilms;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2018-07

4. XPS study of multilayer multicomponent films;Applied Surface Science;2018-01

5. Calculation of Surface Excitation Parameters by a Monte Carlo Method;Chinese Journal of Chemical Physics;2017-02-27
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