Determination of molecular orientation of α-sexithiophene on passivated Si(001) by means of optical reflectance spectroscopic methods-Reference-Cited by-同舟云学术

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Determination of molecular orientation of α-sexithiophene on passivated Si(001) by means of optical reflectance spectroscopic methods

Published:2013-10 Issue: Volume:616 Page:36-43
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Toyoshima H.,Inoue K.,Hiraga K.,Ohno S.,Tanaka M.

Funder

Grant-in-Aid for Scientific Research (B)

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference31 articles.

1. Two-dimensional charge transport in self-organized, high-mobility conjugated polymers

2. Ultrahigh-vacuum quasiepitaxial growth of model van der Waals thin films. II. Experiment

3. Charge Carrier Transporting Molecular Materials and Their Applications in Devices

4. Structural order in conjugated oligothiophenes and its implications on opto-electronic devices

5. Sexithiophene films on clean and oxidized Si(111) surfaces: Growth and electronic structure

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1. In-Situ Photoelectron Spectroscopy Investigation of Sulfurization-Induced Sodiophilic Sites with Model Systems of α-sexithiophene and p-sexiphenyl;Batteries;2022-12-27

2. Energetic disorder impacts energy-level alignment of alpha-sexithiophene on hydrogen-terminated silicon and silicon oxide;Materials Research Express;2022-08-01

3. Electronic structure of α-sexithiophene ultrathin films grown on;Physical Chemistry Chemical Physics;2018

4. Structural and optoelectronic characterization of organic vapor phase deposited thin films of oriented DH6T molecules;AIP Conference Proceedings;2017

5. Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy;The Journal of Physical Chemistry C;2015-10-13

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