XPS imaging of depth profiles and amount of substance based on Tougaard’s algorithm-Reference-Cited by-同舟云学术

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XPS imaging of depth profiles and amount of substance based on Tougaard’s algorithm

Published:2006-08 Issue:15 Volume:600 Page:3015-3021
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Hajati Shaaker,Coultas Sarah,Blomfield Chris,Tougaard Sven

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference25 articles.

1. Concept of an imaging XPS system

2. Image processing of multispectral x‐ray photoelectron spectroscopy images

3. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy;Artyushkova,2003

4. Direct imaging of plasma-polymerized chemical micropatterns

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