Funder
Institute of Physical Chemistry
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference36 articles.
1. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si. Part V: results of a CCQM pilot study;Seah;Surf. Interface Anal.,2004
2. The attenuation length revisited;Jablonski;Surface Sci. Rep.,2002
3. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Tanuma,2003
4. Progress in quantitative surface analysis by X-ray photoelectron spectroscopy: current status and perspectives;Powell;J. Electron Spectrosc. Relat. Phenom.,2010
5. Surface and Interface Science, Vol 1, Concepts and Methods;Jablonski,2012
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21 articles.
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