Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (111)-oriented PLZT 10/40/60 thin films-Reference-Cited by-同舟云学术

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Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (111)-oriented PLZT 10/40/60 thin films

Published:2008-06 Issue:11 Volume:602 Page:1987-1992
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Ferri A.,Saitzek S.,Da Costa A.,Desfeux R.,Leclerc G.,Bouregba R.,Poullain G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference22 articles.

1. Characterization of PLZT thin film prepared by photochemical deposition using photosensitive metal-organic precursors

2. Polar nanodomains and local ferroelectric phenomena in relaxor lead lanthanum zirconate titanate ceramics

3. Structural and electrical characterization of PLZT 22/20/80 relaxor films obtained by PLD and RF–PLD

4. Elaboration of (111)-oriented La-doped PZT thin films on platinized silicon substrates

5. Preparation and characterization of highly (111)-oriented (Pb,La)(Zr,Ti)O3 thin films by sol–gel processing

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4. Dielectric and Piezoelectric Properties of PLZT x/40/60 (x = 5; 12) Ceramics;Russian Microelectronics;2021-12

5. Dielectric and piezoelectric properties of PLZT x/40/60 (x = 5; 12) ceramics;Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering;2021-09-21

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