In situ X-ray multilayer reflectometry based on the energy dispersive method-Reference-Cited by-同舟云学术

In situ X-ray multilayer reflectometry based on the energy dispersive method

Published:2000-01 Issue:1-6 Volume:173 Page:255-263
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Malaurent J.C,Duval H,Chauvineau J.P,Hainaut O,Raynal A,Dhez P

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. Controlled fabrication of multilayer soft‐x‐ray mirrors

2. E. Spiller, in : D.T. Attwood, B.L. Henke (Eds.), American Institute of Physics, New York, 1981, 124.

3. E. Lüken, E. Ziegler, P. Hoghoj, A. Freund, E. Gerdau, A. Fontaine, Physics of X-ray Multilayer Structures, Vol. 6 of 1994 OSA Technical Digest Series, Optical Society of America, Washington, DC, 1994.

4. Polarization analysis and applications to device technology;Lüken;SPIE,1996

5. Density of the Lunar Surface

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