A far-field method for characterizing thin planar optical waveguides-Reference-Cited by-同舟云学术

A far-field method for characterizing thin planar optical waveguides

Published:1997-07 Issue:4-6 Volume:139 Page:205-208
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Rams J,Cabrera J.M

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry

2. Use of far-field radiation pattern to characterise single-mode symmetric slab waveguides

3. Characterisation of single-mode channel waveguides from far field measurements

4. Characterisation of Single-Mode Asymmetric Slab Waveguide from Far Field Intensity Pattern

5. Determination of core diameter and refractive-index difference of single-mode fibres by observation of the far-field pattern

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