Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement-Reference-Cited by-同舟云学术

Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement

Published:2002-07 Issue:1-3 Volume:208 Page:17-24
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Martı́nez-Celorio R.A,Barrientos B,Sanchez-Marı́n Francisco J,López Luis Martı́,Rayas J.A

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Speckle Metrology;Erf,1978

2. Holographic and Speckle Interferometry;Jones,1989

3. Speckle Metrology;Sirohi,1993

4. Additive/subtractive decorrelated electronic speckle pattern interferometry

5. Speckle interferometric damage investigation of fibre-reinforced composites

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