Extension of the analytical range of total reflection X-ray fluorescence spectrometry to lighter elements (11 ⩽ Z < 16) and increase in sensitivity by excitation with tungsten Lα radiation-Reference-Cited by-同舟云学术

Extension of the analytical range of total reflection X-ray fluorescence spectrometry to lighter elements (11 ⩽ Z < 16) and increase in sensitivity by excitation with tungsten Lα radiation

Published:1989-01 Issue:5 Volume:44 Page:499-504
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Freitag K.,Reus U.,Fleischhauer J.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference4 articles.

1. K. Freitag, The TXRF Spectrometer EXTRA II. In Totalreflexions-Röntgenfluoreszensanalyse (1. Workshop), Ed. W. Michaelis and A. Prange. GKSS 86/E/61.

2. Deutsches Patent No. 2736960, Patent holder: GKSS Forschungszentrum, Geesthacht, F.R.G. Licensee: Rich. Scifert & Co., Röntgenwerk, Ahrensburg, F.R.G.

3. Determination of metals in oil using total reflection X-ray fluorescence spectrometry

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