Determinations of Ce, Eu and Tb in the electroluminescent materials Gd2O2S and La2O2S by total-reflection X-ray spectrometry
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference6 articles.
1. Physics and technology of thin film electroluminescent displays
2. Energy dependence of the, sensitivity of sequential x-ray spectrometers obtained from multi-element standards
3. Total reflection X-ray fluorescence analysis of the rare earth elements by K-shell excitation
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