Photoelectron spectroscopy studies of microcrystalline/amorphous silicon interfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Static Charge Fluctuations in Amorphous Silicon
2. L. Ley, in: J.D. Joannopoulos, G. Lucovsky (Eds.), Hydrogenated Amorphous Silicon II, Topics in Applied Physics, 56, 1984, p. 85
3. Theoretical study of grain boundaries in Si: Effects of structural disorder on the local electronic structure and the origin of band tails
4. Core‐level shifts of silicon–hydrogen species on chemically treated Si surfaces studied by high‐resolution x‐ray photoelectron spectroscopy
5. Ge/Si(100) heterostructures: a photoemission and low-energy yield spectroscopy investigation
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