Microstructure and dynamics of hydrogen in a-Si:H detected by nuclear magnetic resonance-Reference-Cited by-同舟云学术

Microstructure and dynamics of hydrogen in a-Si:H detected by nuclear magnetic resonance

Published:2000-05 Issue: Volume:266-269 Page:185-189
ISSN:0022-3093
Container-title:Journal of Non-Crystalline Solids
language:en
Short-container-title:Journal of Non-Crystalline Solids

Author:

Baugh Jonathan,Han Daxing,Kleinhammes Alfred,Liu Chunlei,Wu Yue,Wang Qi

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. H. Fritzsche, in: S. Wagner, M. Hack, E.A. Schiff, R. Schropp, I. Shimizu (Eds.), Amorphous and Microcrystalline Silicon Technology, San Francisco, CA, Mater. Res. Soc. Proc. 467 (1997) 19

2. Proton-magnetic-resonance studies of microstructure in plasma-deposited amorphous-silicon—hydrogen films

3. H1NMR ina-Si

4. Hydrogen Distribution in High Stability A-Si:H Prepared by the Hot Wire Technique

5. R. Arya, A. Catalano, M. Bennett, J. Newton, B. Fieselman, L. Yang, Y.M. Li, R. D’Aiello, in: Proceedings of the 11th EC PVSEC, 1992, p. 199

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