Direct solid-sampling electrothermal atomic absorption spectrometry methods for the determination of silicon in oxides of niobium, titanium and zirconium-Reference-Cited by-同舟云学术

Direct solid-sampling electrothermal atomic absorption spectrometry methods for the determination of silicon in oxides of niobium, titanium and zirconium

Published:2001-09 Issue:9 Volume:56 Page:1645-1656
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Dong Huang Mao,Krivan Viliam

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference36 articles.

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4. Multi-element characterization of titanium(IV) oxide by electrothermal atomic absorption spectrometry, inductively coupled plasma atomic emission spectrometry, inductively coupled plasma mass spectrometry and total reflection X-ray fluorescence spectrometry after matrix–analyte separation

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