Direct determination of trace elements in tungsten products using an inductively coupled plasma optical emission charge coupled device detector spectrometer-Reference-Cited by-同舟云学术

Direct determination of trace elements in tungsten products using an inductively coupled plasma optical emission charge coupled device detector spectrometer

Published:1998-09 Issue:10 Volume:53 Page:1405-1412
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Xiuhuan Yang,Jinfang Wei,Hongtao Liu,Baoying Tang,Zhanxia Zhang

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference8 articles.

1. Trace-matrix separations for high-purity chromium, molybdenum and tungsten with cellulose collectors;Blodorn;Mikrochim. Acta,1989

2. Bestimmung von spurenelementen in wolfram mit sequentieller ICP–AES;Ullmann;Fresenius' Z. Anal. Chem.,1986

3. Rapid determination of molybdenum in tungsten by ICP–AES monochromator with scanning;Xu;Guangpu Shiyanshi (China),1987

4. Ultraspurenanalytik in hochreinem molybdan und wolfram mit ionenchromatographischer spuren-matrix-trennung;Serburt;Anal. Chim. Acta,1992

5. On-line coupling of ion chromatography and atomic spectrometry and use of direct graphite furnace atomic absorption spectrometry as new tools for ultra trace determinations in refractory materials;Serburt;Mikrochim. Acta,1995

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