Total-reflection X-ray fluorescence analysis of geological microsamples-Reference-Cited by-同舟云学术

Total-reflection X-ray fluorescence analysis of geological microsamples

Published:2000-03 Issue:3 Volume:55 Page:205-212
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Ebert M.,Mair V.,Tessadri R.,Hoffmann P.,Ortner H.M.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference23 articles.

1. Total-reflection X-ray fluorescence analysis;Klockenkämper,1997

2. G. Tölg, The role of TXRF amongst the methods of atomic spectroscopy, 4th Work-shop on Total-Reflection X-Ray Fluorescence Spectrometry, Book of Abstracts, 1992, 7.

3. A Handbook of Silicate Rock Analysis;Potts,1987

4. Microanalysis of solid samples by total-reflection x-ray fluorescence spectrometry

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