Direct hard X-ray photodetector with superior sensitivity based on ZnGa2O4 epilayer grown by metalorganic chemical vapor deposition-Reference-Cited by-同舟云学术

Direct hard X-ray photodetector with superior sensitivity based on ZnGa2O4 epilayer grown by metalorganic chemical vapor deposition

Published:2023-08 Issue: Volume:19 Page:100411
ISSN:2590-0498
Container-title:Materials Today Advances
language:en
Short-container-title:Materials Today Advances

Author:

Rana Siddharth,Chiu Shang-Jui,Huang Chih-Yang,Tairtan Fu-Gow,Lin Yan-Gu,Wuu Dong-Sing,Singh Jitendra Pratap^ORCID,Su Guang-Cheng,Liu Po-Liang^ORCID,Horng Ray-Hua^ORCID

Publisher

Elsevier BV

Subject

Mechanical Engineering,General Materials Science

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