Ellipse detection and phase demodulation for wood grain orientation measurement based on the tracheid effect-Reference-Cited by-同舟云学术

Ellipse detection and phase demodulation for wood grain orientation measurement based on the tracheid effect

Published:2003-01 Issue:1 Volume:39 Page:73-89
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Zhou James,Shen Jun

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

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4. Soest JF, Matthews PC. Laser scanning technique for defect detection. Proceedings of the First International Conference on Scanning Technology in Sawmilling, 1985. p. XVII1–4.

5. Matthews PC. Wood, light and objective scanning. Proceedings of the Second International Conference on Scanning Technology in Sawmilling, 1987. p. XI1–13.

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