Author:
Newman Timothy S.,Jain Anil K.
Subject
Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software
Reference42 articles.
1. S. Nayar, L. Weiss, D. Simon and A. Sanderson, “Structural highlight inspection of specular surfaces using extended Gaussian images,” 1988 Carnegie Mellon Robotics Inst. Ann. Res. Rev., 55–65.
2. An efficient method for inspecting machine parts by a fixtureless machine vision system;Ker,1990
3. Automatically inspecting gross features of machined objects using three-dimensional depth data;Marshall,1990
4. IVIS: An integrated volumetric inspection system;Tarbox,1994
5. A rule based approach for visual pattern inspection;Darwish;IEEE Trans. Pattern Anal. Mach. Intell.,1988
Cited by
36 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献