1. Patterns in pattern recognition: 1968–1974;Kanal;IEEE Trans. Pattern Recognition IT-20,1974
2. Optimal linear and nonlinear feature extraction based on the minimization of the increased risk of misclassification;deFigueiredo,1974
3. An iterative approach to the feature selection problem;Decell,1972
4. A direct method of nonparametric measurement selection;Whitnwy;IEEE Trans. Comput. C-20,1971
5. Experimental study of information measure and inter-intra class distance ratios on feature selection and orderings;Michael;IEEE Trans. Syst., Man, Cybern SMC-3,1973