Computer analysis of multi-channel SEM and X-ray images from fine particles-Reference-Cited by-同舟云学术

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Computer analysis of multi-channel SEM and X-ray images from fine particles

Published:1972-05 Issue:2 Volume:4 Page:173-193
ISSN:0031-3203
Container-title:Pattern Recognition
language:en
Short-container-title:Pattern Recognition

Author:

White E.W.,Mayberry K.,Johnson G.G.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference13 articles.

1. Scanning electron microscopy;Oatley;Adv. in Electronics Electron Phys.,1965

2. The characteristics and applications of the Scanning Microscope;Kimoto;Mat. Res. Standards,1969

3. Scanning Electron Microscopy;Thornton,1968

4. Automatic microscopes for the paint technologists—Part 4;Kaye;J. Paint Technol.,1968

5. Scanning Electron Microscopy/1968,1968

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 4;2022

2. Notes and References for Volume 3;Principles of Electron Optics;1996

3. Notes and References;Principles of Electron Optics;1994

4. Fully automated SEM image analysis;Scanning;1986

5. Processing Ternary Sulfide Ceramics: Powder Preparation, Sintering, and Hot-Pressing;Journal of the American Ceramic Society;1983-01

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