NEXAFS study on carbon-based material formed by focused-ion-beam chemical-vapor-deposition-Reference-Cited by-同舟云学术

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NEXAFS study on carbon-based material formed by focused-ion-beam chemical-vapor-deposition

Published:2006-11 Issue:11 Volume:75 Page:1850-1854
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Kanda Kazuhiro,Igaki Jun-ya,Kato Yuri,Kometani Reo,Saikubo Akihiko,Matsui Shinji

Publisher

Elsevier BV

Subject

Radiation

Reference12 articles.

1. NEXAFS spectra of graphite;Batson;Phys. Rev. B,1993

2. Young’ modulus of DLC pillars grown by FIB-CVD;Fujita;J. Vac. Sci. Technol. B,2001

3. NEXAFS spectra of DLC films;Jaouen;Diamond Relat. Mater.,1995

4. NEXAFS spectra of DLC films formed by GCIB method;Kanda;Jpn. J. Appl. Phys.,2002

5. NEXAFS study on DLC films;Kanda;Nucl. Instr. and Meth. (B),2003

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