Cross sections for electron scattering from selected components of DNA and RNA
Author:
Publisher
Elsevier BV
Subject
Radiation
Reference37 articles.
1. Low-energy (5–40eV) electron-stimulated desorption of anions from physisorbed DNA bases;Abdoul-Carime;Radiat. Res.,2001
2. Site-specific dissociation of DNA bases by slow electrons at early stages of irradiation;Abdoul-Carime;Phys. Rev. Lett.,2004
3. Mechanism for damage to DNA by low-energy electrons;Barrios;J. Phys. Chem. B,2002
4. Calculation of electron impact ionization cross section of DNA using the Deutsch-Märk and Binary-Encounter-Bethe formalisms;Bernhardt;Int. J. Mass Spectrom.,2003
5. Modeling of ultrasoft X-ray induced DNA damage using structured higher order DNA targets;Bernhardt;Int. J. Mass Spectrom.,2003
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