Depth dose curve and surface dose measurement with a μm thin dosimetric layer-Reference-Cited by-同舟云学术

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Depth dose curve and surface dose measurement with a μm thin dosimetric layer

Published:2021-11 Issue: Volume: Page:109881
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Schuster Christiane^ORCID,Kuntz Florent,Cloetta Dominique^ORCID,Zeller Marcel,Katzmann Julia,Strasser Alain,Härtling Thomas,Lavalle Marco

Publisher

Elsevier BV

Subject

Radiation

Reference5 articles.

1. Detection methods for cereal grains treated with low and high energy electrons;Cutrubinis;Radiat. Phys. Chem.,2005

2. D-mu-A new concept in industrial low-energy electron dosimetry;Helt-Hansen;Radiat. Phys. Chem.,2010

3. Dosimetry for Radiation Processing;McLaughlin,1989

4. 3D relative dose measurement with a μm thin dosimetric layer;Schuster;Radiat. Phys. Chem.,2020

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigations on electron beam irradiated rare-earth doped SrF₂ for application as low fading dosimeter material: evidence for and DFT simulation of a radiation-induced phase;Journal of Materials Chemistry C;2022

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