PIXE and PIXE-induced XRF for chemical specification
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference14 articles.
1. S.A.E. Johansson, J.L. Cambell, PIXE: A Novel Technique for Elemental Analysis, Wiley, NewYork, 1988
2. Chemical effects in PIXE spectra
3. Bonding Effect on FKαSatellite Structure Produced by 84-MeVN4+
4. Nickel Lα spectra measured by a high resolution particle induced X-ray emission (PIXE) spectrometer
5. Estimation of F Kα K1L1 satellite intensity based on the MO scheme
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1. Control of the chemical state change of sulfur in solid compound targets during high-resolution PIXE measurements;Journal of the Korean Physical Society;2012-07
2. Determining Electronic Structure from Auger Spectra in the Cluster Approximation;Hartree-Fock-Slater Method for Materials Science;2006
3. Particle induced X-ray emission – relative yield ion energy dependence, an IBA chemical speciation method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04
4. Chemical state analysis employing sub-natural linewidth resolution PIXE measurements of Kα diagram lines;X-Ray Spectrometry;2005
5. XANES spectra of sesqui-oxides of Al, Cr and Fe;Journal of Electron Spectroscopy and Related Phenomena;2001-03
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