Defect imaging using convergent beam ion channeling patterns-Reference-Cited by-同舟云学术

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Defect imaging using convergent beam ion channeling patterns

Published:1998-04 Issue:1-2 Volume:140 Page:178-184
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Breese M.B.H,Bailes III A.A

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. J.K. Lindhard, Dan. Vidensk Selsk. Mat. Fys. Medd. 34 (14) (1965)

2. D.V. Morgan (Ed.), Channeling, Theory, Observation and Applications, Wiley, London, 1973

3. L.C. Feldman, J.W. Mayer, S.T. Picraux, Materials Analysis by Ion Channeling, Academic Press, New York, 1982

4. Channeling and related effects in the motion of charged particles through crystals

5. M.B.H. Breese, D.N. Jamieson, P.J.C. King, Materials Analysis using a Nuclear Microprobe, Wiley, New York, 1996

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion optical study of a transmission ion microscope;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09

2. Phase space analysis of planar channeled MeV protons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-11

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