A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF-Reference-Cited by-同舟云学术

A new UHV diffractometer for surface structure and real time molecular beam deposition studies with synchrotron radiations at ESRF

Published:1999-01 Issue:1-2 Volume:149 Page:213-227
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Baudoing-Savois R.,De Santis M.,Saint-Lager M.C.,Dolle P.,Geaymond O.,Taunier P.,Jeantet P.,Roux J.P.,Renaud G.,Barbier A.,Robach O.,Ulrich O.,Mougin A.,Bérard G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. J.M. MacLaren, J.B. Pendry, P.J. Rous, D.K. Saldin, G.A. Somorjai, M.A. van Hove, D.D. Vvedensky, Surfaces Crystallographic Information Service: a Handbook of Surface Structures, Reidel, Dordrecht, 1987

2. Surface X-ray diffraction

3. H. Dosch, Critical Phenomena at Surfaces and Interfaces, Springer Tracts in Modern Physics, vol. 126, Springer, Berlin, 1992

4. Surface structure determination by X-ray diffraction

5. ESRF Beamline Handbook, 1993

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