Dual detector system for PIXE measurement covering a wide element range

Author:

Kobayashi K.,Koizumi Y.,Nakano C.,Hatori S.,Sunohara Y.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Three-dimensional Element-by-element Surface Topography Reconstruction of Compound Samples Using Multisegment Silicon Drift Detectors;Microscopy and Microanalysis;2023-11-07

2. Current status of MALT AMS facility: A report of updated performance and recent achievement;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-01

3. Void and cavity determination in micro-PIXE analysis of composed material using binocular detectors: A computational study;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08

4. The status of the AMS system at MALT in its 20th year;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-10

5. Surface topography reconstruction by stereo-PIXE;Journal of Analytical Atomic Spectrometry;2012

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