Chemical state analysis of Cu, Cu2O and CuO with WDX using an ion microbeam

Author:

Kawatsura K,Takeshima N,Takahiro K,Mokuno Y,Horino Y,Kinomura A,Chayahara A,Tsubouchi N,Sekioka T,Terasawa M

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Assay of Trace Copper Ion in Water Resources Using a Photo-sensing Diode Circuit;Current Analytical Chemistry;2022-12

2. High resolution K X-ray spectra of selected silicates induced by MeV proton and carbon micro-beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-02

3. Study of ion beam induced chemical effects in silicon with a downsized high resolution X-ray spectrometer for use with focused ion beams;Journal of Analytical Atomic Spectrometry;2016

4. Wavelength dispersive μPIXE setup for the ion microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-11

5. H+and He2 +induced W L X-rays intensity ratios: part I, Si(Li) data and EDS high resolution insight;X-Ray Spectrometry;2013-02-12

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