Defect engineering in Czochralski silicon by electron irradiation at different temperatures
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. New Oxygen Infrared Bands in Annealed Irradiated Silicon
2. Infrared Absorption Spectra of Oxygen-Defect Complexes in Irradiated Silicon
3. Infrared Studies of Defect Production inn-Type Si: Irradiation-Temperature Dependence
4. Electron irradiation damage in silicon containing carbon and oxygen
5. Radiation Effects in Semiconductors;Brelot,1971
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