High resolution RTE measurements at 0° using a hemispherical analyser with lens and 2-D PSD-Reference-Cited by-同舟云学术

High resolution RTE measurements at 0° using a hemispherical analyser with lens and 2-D PSD

Published:1999-06 Issue:1-4 Volume:154 Page:276-280
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Benis E.P.,Zouros T.J.M.,Richard P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. T.J.M. Zouros, D.H. Lee, in: S.M. Shafroth, J.C. Austin (Eds.). Accelerator-based atomic physics techniques and applications, (American Institute of Physics Conference Series, New York, 1997), pp. 426

2. A new hemispherical analyser with 2-D PSD and focusing lens for use in 0° electron spectroscopy

3. A zero-degree tandem electron spectrometer and rydberg analyzer for projectile electron studies in ion-atom collisions

4. E.P. Benis, T.J.M. Zouros, to be published

5. T.J.M. Zouros, in: W.G. Graham, W. Fritsch, Y. Hahn, J. Tanis (Eds.). Recombination of Atomic Ions, NATO Advanced Study Institute Series B: Physics, Plenum Press. New York. 1992, vol. 296, p. 271

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