Investigation of objects d'art by PIXE with 68 MeV protons

Author:

Denker A.,Maier K.H.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. Fitted empirical reference cross sections for K-shell ionization by protons

2. Prompt analysis of heavy elements by high-energy-induced (p, X) reactions

3. High-Energy PIXE using 68 MeV protons

4. Trim V.91-04, J.F. Ziegler, J.P. Biersack, U. Littmark, The Stopping and Ranges of Ions in Matter, Vol. 1, Plenum, New York

5. A. Denker, M. Griesser, K.H. Maier, H. Musner, in: M. Marabelli, C. Parisi (Eds.), Proceedings of the Sixth International Conference on Non-destructive Testing and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage, Rome, 1999, pp. 985–997

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1. New experimental measurements of X-ray emissions induced by protons of several tens of MeV on elements with Z=22 to Z=79: Toward quantitative high-energy PIXE;Radiation Physics and Chemistry;2024-08

2. High energy PIXE: A tool to characterize multi-layer thick samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-02

3. Use of a medical positron emission tomography cyclotron to perform proton-induced X-ray emission analysis;International Journal of PIXE;2018-01

4. Thick multi-layers analysis using high energy PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09

5. Characterization of ancient Greek coins using non-destructive TOF neutron diffraction;Journal of Physics: Conference Series;2012-02-08

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