Composition of Ni–Ta–C thick films using simulated annealing analysis of elastic backscattering spectrometry data-Reference-Cited by-同舟云学术

Composition of Ni–Ta–C thick films using simulated annealing analysis of elastic backscattering spectrometry data

Published:2000-03 Issue: Volume:161-163 Page:287-292
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Jeynes C,Barradas N.P,Wilde J.R,Greer A.L

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

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4. http://www.ee.surrey.ac.uk/SCRIBA/ndf/

5. UHV sputter deposition with a research-scale DC magnetron

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